Cloud-based automatic test data generation framework

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Constraint-Based Automatic Test Data Generation

This paper presents a new technique for automatically generating test data. The technique is based on mutation analysis and creates test data that approximates relative adequacy. The technique is a fault-based technique that uses algebraic constraints to describe test cases designed to find particular types of faults. A set of tools, collectively called Godzilla, has been implemented that autom...

متن کامل

Search Based Automatic Test-Data Generation at an Architectural Level

The need for effective testing techniques for architectural level descriptions is widely recognised. However, due to the variety of domain-specific architectural description languages, there remains a lack of practical techniques in many application domains. We present a simulation-based testing framework that applies optimisation-based search to achieve high-performance testing for a type of a...

متن کامل

A Survey on Automatic Test Data Generation∗

In order to reduce the high cost of manual software testing and at the same time to increase the reliability of the testing processes researchers and practitioners have tried to automate it. One of the most important components in a testing environment is an automatic test data generator — a system that automatically generates test data for a given program. Through the years several attempts in...

متن کامل

An integrated automatic test data generation system

The Godzilla automatic test data generator is an integrated collection of tools that implements a relatively new test data generation method, constraint-based testing, that is based on mutation analysis. Constraint-based testing integrates mutation analysis with several other testing techniques, including statement coverage, branch coverage, domain perturbation and symbolic evaluation. Because ...

متن کامل

SAT-based Automatic Test Pattern Generation

Due to the rapidly growing size of integrated circuits, there is a need for new algorithms for Automatic Test Pattern Generation (ATPG). While classical algorithms reach their limit, there have been recent advances in algorithms to solve Boolean Satisfiability (SAT). Because Boolean SAT solvers are working on Conjunctive Normal Forms (CNF), the problem has to be transformed. During transformati...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Journal of Computer and System Sciences

سال: 2016

ISSN: 0022-0000

DOI: 10.1016/j.jcss.2015.12.001